On-chip detection of power supply vulnerabilities

ABSTRACT

On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.

This application is a continuation of co-pending U.S. patent applicationSer. No. 12/013,833, filed Jan. 14, 2008, entitled “On-Chip Detection ofPower Supply Vulnerabilities,” which is a continuation of U.S. Pat. No.7,355,435, issued Apr. 8, 2008, entitled “On-Chip Detection of PowerSupply Vulnerabilities,” each of which is hereby incorporated herein byreference in its entirety.

This application also contains subject matter which is related to thesubject matter of the following applications, each of which is assignedto the same assignee as this application and hereby incorporated hereinby reference in its entirety:

“Power Supply Insensitive Delay Element,” Dreps et al., U.S. Ser. No.11/056,798, filed Feb. 10, 2005; and

“Power Supply Noise Insensitive Multiplexer,” Sperling et al., U.S. Pat.No. 7,212,062, issued May 1, 2007.

BACKGROUND

This invention relates, in general, to detecting vulnerabilities of avoltage power supply, and in particular, to providing an on-chipdetection capability that facilitates detection of power supplyvulnerabilities.

To maximize performance of computer systems and computer chips, it isimportant to monitor and detect vulnerabilities (e.g., noise) in the oneor more voltage power supplies within the systems or on the chips.Currently, there are a number of techniques used to detect power supplynoise.

One technique for detecting power supply noise is described in a paperentitled “On-Chip Voltage Noise Monitor For Measuring Voltage Bounce InPower Supply Lines Using A Digital Tester,” H. Aoki, M. Ikeda, K. Asada,Proceedings of the 2000 International Conference on Microelectronic TestStructures, 2000, pp. 112-117, which is hereby incorporated herein byreference in its entirety. This paper describes a technique that employsa comparator that compares the noisy supply to a reference voltage. Thecomparator requires four clocks, and the performance of the comparatorstrongly depends on the time constant of the capacitors in the design.The capacitors have to be sized such that the drain-to-gate capacitanceof the transistors does not corrupt the measured data. Hence, thistechnique is extremely sensitive to sizing and does not have anycalibration features.

A further technique is described in a paper entitled “On-Die DroopDetector For Analog Sensing Of Power Supply Noise,” A. Muhtaroglu, G.Taylor, T. Rahal-Arabi, IEEE Journal of Solid-State Circuits, Vol. 39,Issue 4, April 2004, pp. 651-660, which is hereby incorporated herein byreference in its entirety. This paper uses a very complicatedcalibration procedure that requires two 32-bit digital-to-analogconverters (DACs) to generate current references. Also, each sensorrequires a dedicated current reference, since the calibration featuresare a function of the current reference (two 32-bit DACs). Further, thisapproach requires two separate sensors to detect overshoots andundershoots. It also requires two current references to set differentthresholds for overshoots and undershoots. Thus, this technique has ahigh area overhead.

Based on the foregoing, a need still exists for an enhanced capabilityto detect power supply noise and other power supply vulnerabilities. Forexample, a need exists for a non-invasive on-chip detection capability.As a further example, a need exists for an on-chip detection capabilitythat does not employ external components in its detecting.

BRIEF SUMMARY

The shortcomings of the prior art are overcome and additional advantagesare provided through a method of detecting vulnerabilities of powersupplies. The method includes, for instance, detecting, using an on-chipsensor, vulnerability of a power supply of a chip including the on-chipsensor, wherein the on-chip sensor includes a sensitive delay chainsensitive to variations in voltage of the power supply and aninsensitive delay chain insensitive to variations in voltage of thepower supply, the sensitive delay chain and the insensitive delay chainemployed to detect the vulnerability, and wherein an output of theinsensitive delay chain is a delayed signal that is coupled to an inputof a first phase detector and an input of a second phase detector, andan output of the sensitive delay chain is a delayed signal that iscoupled to an input of the first phase detector and an input of thesecond phase detector, and wherein the first phase detector and thesecond phase detector are used to compare the difference in phasebetween the delayed signals from the sensitive delay chain and theinsensitive delay chain to detect vulnerability; and wherein the delayedsignals from the insensitive delay chain and the sensitive delay chainare further delayed using a plurality of delay chains, the plurality ofdelay chains coupled to the output of insensitive delay chain and theoutput of sensitive delay chain and coupled to one or more inputs of thefirst phase detector and one or more inputs of the second phasedetector.

In a further embodiment, a sensing circuit is provided. The sensingcircuit includes, for instance, an on-chip sensor to detectvulnerability of a power supply of a chip including the on-chip sensor,the on-chip sensor detecting the vulnerability absent use of componentsexternal to the chip, wherein the on-chip sensor comprises a pluralityof delay chains to detect the vulnerability, the plurality of delaychains including a sensitive delay chain sensitive to variations involtage of the power supply and an insensitive delay chain insensitiveto variations in voltage of the power supply, and wherein thevulnerability to be detected is based on a user-defined thresholdprovided via one or more controls used to control one or more otherdelay chains coupled to at least one of the insensitive delay chain andthe sensitive delay chain.

In yet a further embodiment, a chip is provided. The chip includes, forinstance, a on-chip sensor to detect vulnerability of a power supply ofthe chip absent use of components external to the chip, the on-chipsensor including, for instance, a sensitive delay chain sensitive tovariations in voltage of the power supply; and an insensitive delaychain insensitive to variations in voltage of the power supply, thesensitive delay chain and the insensitive delay chain used to detect thevulnerability, wherein the vulnerability to be detected is based on auser-defined threshold provided via one or more controls used to controlone or more other delay chains coupled to at least one of theinsensitive delay chain and the sensitive delay chain.

Additional features and advantages are realized through the techniquesof the present invention. Other embodiments and aspects of the inventionare described in detail herein and are considered a part of the claimedinvention.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

One or more aspects of the present invention are particularly pointedout and distinctly claimed as examples in the claims at the conclusionof the specification. The foregoing and other objects, features, andadvantages of the invention are apparent from the following detaileddescription taken in conjunction with the accompanying drawings inwhich:

FIG. 1 depicts one embodiment of an on-chip Vdd sensor, in accordancewith an aspect of the present invention;

FIG. 2 a depicts one example of a sensitive delay chain of the on-chipsensor of FIG. 1, in accordance with an aspect of the present invention;

FIG. 2 b depicts one example of a delay element of the delay chain ofFIG. 2 a that is sensitive to power supply vulnerabilities, inaccordance with an aspect of the present invention;

FIG. 2 c depicts one example of a control used to manage an amount ofdelay through the delay chain of FIG. 2 a, in accordance with an aspectof the present invention;

FIG. 3 a depicts one example of an insensitive delay chain of theon-chip sensor of FIG. 1, in accordance with an aspect of the presentinvention;

FIG. 3 b depicts one example of a delay element of the delay chain ofFIG. 3 a that is insensitive to power supply vulnerabilities, inaccordance with an aspect of the present invention;

FIG. 4 depicts one embodiment of a delay line that includes one or moredelay elements of FIG. 3 b, in accordance with an aspect of the presentinvention;

FIG. 5 depicts further details of a bias voltage generator of the delayline of FIG. 4, in accordance with an aspect of the present invention;

FIG. 6 depicts one example of a chip having a plurality of sensorsincorporated therein, in accordance with an aspect of the presentinvention; and

FIG. 7 illustrates the relationship between the delay of the insensitivedelay chain and the sensitive delay chain of FIG. 1 with a variation insupply voltage, in accordance with an aspect of the present invention.

DETAILED DESCRIPTION

In accordance with an aspect of the present invention, an on-chip Vddsensor detects vulnerabilities (e.g., overshoots and undershoots) of apower supply voltage compared to a user defined threshold. The sensorincludes two delay chains, one insensitive and the other sensitive tovoltage variations. The relative difference in the phase of the twodelay chains indicates the occurrence of an overshoot or undershoot ofthe voltage supply being monitored.

One example of an on-chip Vdd sensor is described with reference toFIG. 1. In one example, an on-chip Vdd sensor 100 includes a sensitivedelay chain 102 and an insensitive delay chain 104, each of whichreceives as input a signal 106, such as a clock signal, data signal orother digital signal. The output of sensitive delay chain 102 is adelayed signal, which is input to additional delay chains 108 and 110,which further delay the signal. The output of delay chain 108 is inputto a phase detector 112 and the output of delay chain 110 is input to aphase detector 114. The phase detectors are used to determine if thereis an undershoot or overshoot, as described below.

Similarly, the output of insensitive delay chain 104 is a delayed signalthat is input to additional delay chains 116 and 118, which furtherdelay the signal. The output of delay chain 116 is input to phasedetector 112 and the output of delay chain 118 is input to phasedetector 114. In this example, the phase detectors are balanced with theaddition of mimic delay elements 108, 118, respectively. Additionaldetails regarding the components of the on-chip sensor are described infurther detail below.

Sensitive delay chain 102 includes a plurality of delay elements 200(FIG. 2 a) coupled to one another to form the delay chain. The number ofdelay elements included in the chain is dependent on the amount ofdesired delay. As examples, the delay chain includes 32 or 64 delayelements or any other number that provides the desired delay. Each delayelement is used to provide delay and the delay elements of this delaychain are sensitive to power supply noise and other vulnerabilities. Oneexample of a power supply sensitive delay element is described infurther detail with reference to FIG. 2 b.

As shown in FIG. 2 b, a delay element 200 includes a double inverterstructure in which a transistor 202 (T1) and a transistor 204 (T2) aregated by an input signal 206 (A). and 204 have commonly connected drains208, which gate a second set of (T3) and 212 (T4). The drains of thosetransistors are also commonly connected (214) and provide the output at216 (Z).

In this example, transistors T1 and T3 are PFET transistors tied to apower supply (Vdd) 218 of the delay element, and transistors T2 and T4are NFET transistors tied to ground 220.

The delay is determined by the amount of current through the transistorsand the capacitive load at their output. The load that the transistorssee is constant, since it is a parasitic gate capacitance. The currentthrough the transistors is varied by any supply voltage (Vdd) variation,since it is proportional to gate-to-source voltage. This delay elementis thus sensitive to vulnerabilities of the power supply of the delayelement.

Returning to FIG. 1, as shown, in this example, sensitive delay chain102 is controllable by a control, referred to as CNTRL-2. This controlenables the delay chain to produce a variable amount of delay. Forinstance, more delay may be chosen by selecting additional delayelements of the chain, and less delay may be chosen by selecting fewerdelay elements.

The selecting of the desired number of delay elements is provided viaone or more multiplexors (MUXs) coupled to the outputs of the delayelements. For instance, as depicted in FIG. 2 c, a multiplexor 230receives as inputs 232 the output of a plurality of delay elements 200and produces an output 234 via one or more selects 236. In this example,multiplexor 230 is a 4:1 mux receiving four inputs and producing oneoutput. However, in other examples, other size multiplexors may be usedwithout departing from the spirit of the present invention. Moreover,other types of multiplexors may be used. As one example, a multiplexorinsensitive to power supply vulnerabilities may be used. One embodimentof such a multiplexor is described in “Power Supply Noise InsensitiveMultiplexer,” Sperling et al., U.S. Pat. No. 7,212,062, issued May 1,2007, which is hereby incorporated herein by reference in its entirety.The output of the multiplexor may be input to another multiplexor, ifthere are more delay elements to be multiplexed, or input to delaychains 108 (FIG. 1), 110, if further selection is not desired.

Similar to sensitive delay chain 102, insensitive delay chain 104(FIG. 1) also includes a plurality of delay elements 300 (FIG. 3 a)(e.g., 32, 64, or any other value that provides the desired delay).However, the delay elements of this delay chain are insensitive tovulnerabilities in the power supply. These vulnerabilities include noiseand/or other external factors that cause unwanted voltage fluctuations,as examples. The delay elements are insensitive in that the delay variesproportionally less than the power supply fluctuations. One embodimentof an insensitive delay element is described below with reference toFIG. 3 b.

An insensitive delay element 300 includes, for instance, a doubleinverter structure 302, similar to the inverter structure described withreference to FIG. 2 b, as well as a header structure 304 and a footerstructure 306 coupled thereto. For instance, the sources of transistorsT2 and T6 of inverter structure 302 are connected to the drains oftransistors T1 and T5, respectively, of header structure 304. Similarly,the sources of transistors T3 and T7 of inverter structure 302 areconnected to the drains of transistors T4 and T8, respectively, offooter structure 306.

Transistors T1 and T5 are tied to a power supply (Vdd) 308, and they aregated by an input 310, referred to as pBIAS, as described below.Further, transistors T4 and T8 are tied to ground 312 and are gated byan input 314, referred to as nBIAS, which is also described below. Inthis example, the transistors of header structure 304 are PFETtransistors and the transistors of footer structure 306 are NFETtransistors. However, in other examples, the type of transistors ineither structure or in the inverter structure may be different than thatshown here.

Delay element 300 has a characteristic of producing constant delay(i.e., delay with little or no variation; e.g., +/−about 1% ofvariation) within a range of voltage variation (e.g., +/−15% ofvariation). This is possible by limiting the current through thetransistors using the pBIAS and nBIAS voltages. Since PFET transistorsT1 and T5's gate-to-source voltage is held constant by the pBIAS inputvoltage, the current through T1 and T5 is held constant against unwantedVdd fluctuations. The same is true with NFET transistors T4 and T8 wherethe gate voltage is provided by the nBIAS input voltage.

The inputs, pBIAS and nBIAS, of delay element 300 are provided by a biasvoltage generator, which is coupled to the delay elements, as depictedin FIG. 4. Specifically, in this embodiment, the delay elements and thebias voltage generator are components of a delay line 400 used tofacilitate the providing of power supply insensitive delay.

As one example, delay line 400 includes, for instance, a referencecurrent generator 402 coupled to a bias voltage generator 404 which isfurther coupled to one or more delay elements 406. Reference currentgenerator 402 generates a constant amount of current regardless of thepower supply voltage variation (i.e., regardless of unwanted variationwithin a range due to power supply vulnerabilities). This referencecurrent is used by the bias voltage generator to generate referencevoltages for the delay elements. The delay element's delay is determinedby the amount of current generated by the reference current generator,which shows constant current against voltage variation. Thus, the delayelement has an enhanced power supply insensitivity compared withconventional delay elements.

Reference current generator 402 is a conventional circuit, such as abandgap reference circuit or a resistor based circuit, which is used toprovide a constant (e.g., little or no change) current reference. Thebandgap based reference current generator provides a constant currentagainst any power supply voltage and temperature variations. One exampleof a bandgap reference circuit is described in U.S. Pat. No. 5,053,640,entitled “Bandgap Voltage Reference Circuit,” Yum, issued Oct. 1, 1991,which is hereby incorporated herein by reference in its entirety.

The output of the reference current generator is input to bias voltagegenerator 404, which uses the reference current from the referencecurrent generator to generate pBIAS and nBIAS voltages that are used toset the delay in the delay elements. One function of this circuit is toform a constant voltage from Vdd-to-pBIAS and nBIAS-to-ground (GND).This is accomplished by mirroring the reference current generator inputcurrent to a second branch, as described with reference to FIG. 5.

FIG. 5 depicts one example of a bias voltage generator 500. Input tobias voltage generator 500 is current from the reference currentgenerator as indicated at 502. There are two outputs, pBIAS 504 andnBIAS 506. The current input is gated to transistors T1, T3 and T4.Mirroring is provided from T1 to T4 and a cascode is added by theprovision of transistor T3. Transistor T3 is coupled in series withtransistors T2 and T4. Further, a mirror is provided from transistor T2to T5, which are tied to a power supply 508. A cascode is added by theinclusion of transistor T6. Transistors T2, T5 and T6 are gated to thesame source. Transistors T5 and T6 are coupled in series with transistorT7. The gate voltages of T6 and T7 provide a pBIAS output voltage 504and nBIAS output voltage 506, respectively. Transistors, T1, T4 and T7are tied to ground 510.

In this particular embodiment, transistors T3 and T6 have a low voltagethreshold (VT), i.e., a voltage threshold lower than that of T4 and T5,respectively (e.g., approximately, 30% lower). By using low VTtransistors, cascoding is provided without the need for additional biasvoltage, since the gate voltage of T3 and T4 is shared. By cascodingthese two lines, there is higher impedance looking at the output of thetwo current mirrors. This higher impedance gives better current matchingin a current mirror.

Referring back to FIG. 4, the outputs of the bias voltage generator,pBIAS and nBIAS, are input to each of delay elements 406. One example ofdelay element 406 is described with reference to FIG. 3 b. The pBIAS andnBIAS voltages are used to provide a delay that is insensitive to powersupply voltage vulnerabilities. A signal, such as a clock, data or otherdigital signal, is input at 408 and a delayed signal is output at 410.The delay provided through the delay elements is relatively insensitiveto power supply noise and other vulnerabilities (e.g., the delay doesnot change within +/−15% of voltage variation).

Returning to FIG. 1, as with sensitive delay chain 102, insensitivedelay chain 104 is also programmable. That is, in this embodiment, thedelay through delay chain 104 is controllable via CNTRL-1. CNTRL-1includes, as one example, one or more multiplexors coupled to the outputof the delay elements of the delay chain, similar to that described withreference to FIG. 2 c. The multiplexors used to control the delay ininsensitive delay chain 104 are the same type of multiplexors as thoseused to control the delay through delay chain 102. However, in anotherembodiment, the multiplexors for one delay chain may be different thanthe multiplexors for another delay chain. Moreover, the number ofmultiplexors for one delay chain may be the same or different than thenumber used for another delay chain.

The outputs of sensitive delay chain 102 and insensitive delay chain 104are input to a plurality of additional delay chains to further delay thesignal. In particular, the output of sensitive delay chain 102 is inputto a delay chain 108 and a programmable delay chain 110. Further, theoutput of insensitive delay chain 104 is input to a programmable delaychain 116 and a delay chain 118. In this example, each delay chain is aninsensitive delay chain that includes a plurality of delay elements(e.g., 4-10). However, in other embodiments, one or more of the delaychains may be sensitive chains, and more or less delay elements may beincluded in each chain. Each delay chain 108, 110, 116, 118 may have thesame number of delay elements, a different number of delay elements, orany combination thereof. Similarly, delay chain 102 and delay chain 104may have the same number of delay elements or a different number ofdelay elements. Yet further, a particular delay chain may include a mixof insensitive and sensitive delay elements.

Delay chains 116 and 110 are programmable in this embodiment. That is,more or less delay may be provided in each chain depending on auser-defined threshold. For instance, if the user-defined thresholdindicates that fluctuations exceeding a particular value (e.g., 10%) areto be detected, then the delay is controlled such that thosefluctuations are detected. Each of these controls is, for example, oneor more multiplexors, as described with reference to CNTRLs-1 and 2.

The output of additional delay chains 116 and 108 are input to a phasedetector 112, and the output of additional delay chains 110 and 118 areinput to a phase detector 114. The phase detectors are employed tocompare the relative difference in phase between delay chains 102 and104. Each of phase detectors 112, 114 is, for instance, an edgetriggered D-type flip flop in which one of the delay chains drives theD-input and the other drives the clock input. For example, the output ofdelay chain 116 drives the D-input of phase detector 112 and the outputof delay chain 108 drives the clock input of phase detector 112.Similarly, the output of delay chain 110 drives the D-input of phasedetector 114 and the output of delay chain 118 drives the clock input ofphase detector 114.

The output of phase detector 112 specifies an undershoot, if the outputof the phase detector is high (e.g., binary 1) indicating that theoutput of delay chain 116 reached phase detector 112 prior to the outputof delay chain 108 clocking the phase detector. Likewise, the output ofphase detector 114 specifies an overshoot, if the output of the phasedetector is high, indicating that the output of delay chain 110 reachedphase detector 114 prior to the output of delay chain 118 clocking thephase detector. Should the output of both phase detectors be high at thesame time, then an error 120 is indicated.

Described above is an on-chip sensor that detects voltage supplyvulnerabilities. The sensor is programmable in various ways enablingdifferent frequencies to be monitored. The on-chip sensor is included inone or more places on a chip, as depicted in FIG. 6. The on-chip sensoris simple and flexible, and thus, is able to be included in as manylocations as desired to monitor voltage supplies and detectvulnerabilities in those supplies. The sensor detects thevulnerabilities without using external off-chip components, such asclocks and/or external pins.

The sensor includes, for instance, two delay chains: one that isdesigned from common logic that is typically found on the chip (i.e.,the sensitive delay chain), and one that is designed out of voltageinsensitive circuitry (i.e., the insensitive delay chain). The relativedifference in phase between those two chains indicates the occurrence ofan overshoot or undershoot of the Vdd supply. The Vdd variations areused to modulate the delay of the sensitive delay chain. Phase detectorsare used to detect the difference in the phase of the two delay chains.In the event of an overshoot, the delay of the sensitive delay chaindecreases, and conversely, in the event of an undershoot, the delayincreases. Various thresholds can be set by using additional matcheddelay elements, which are insensitive to Vdd variations. Theseadditional programmable delay elements are placed between the outputs ofthe delay chains and the inputs of the phase detectors. The thresholdsare set by choosing delay elements proportional to the voltagethresholds.

Advantageously, this capability does not require a dedicated on-chipquiet Vdd for comparison with the noisy Vdd supply. This makes thiscapability more practical and feasible than the current approaches.Also, the programmability for setting the various thresholds is done byusing delay elements which is extremely area efficient. This capabilityalso has extreme flexibility in terms of allowing the detection of noiseof a particular frequency by using delay chains of different lengths.Hence, this capability delivers both threshold and frequencyprogrammability.

In designing the on-chip sensor, various design assumptions are made. Inone example, these assumptions include the following:

-   -   1. Noise has a zero mean. The average noise is to equal zero +/−        or else there is a D.C. shift in power supply voltage.    -   2. If the period of the noise is approximately the same as the        total delay in the delay chains, it will be averaged or        integrated out. This is analyzed and characterized.    -   3. If the period of the noise is much greater than the delay in        the delay chains, it is detected.    -   4. The pulse width of the input to the delay chains is to be at        least 2× the phase error generated by the noise between the two        delay chains. Otherwise, the phase detector output is ambiguous.        An error signal is generated, if this condition is violated.        However, as the period of the input of delay chains decreases,        the sampling rate of the sensor increases. Hence, the input        should have as high a frequency as possible to safely operate        and accommodate the maximum expected phase error caused by        noise.    -   5. The voltage insensitive delay chain includes a feedback loop        that compensates for a noisy supply. The loop bandwidth is to be        greater than the noise period. Otherwise, the noise is not        detected. This feedback loop is included, for instance, in the        reference current generator, which is used to provide a constant        current.

In this example, the two delay chains are calibrated either manually, byscript or with an on-chip state machine, as examples, in the followingmanner:

-   -   a) The delay control setting CNTRL-1 of the Vdd insensitive        delay line is set to a desired value, and the sensitive delay        control setting (CNTRL-2) is set to a smaller value as to ensure        the phase detector has a predetermined output, i.e., the        undershoot phase detector outputs a logic level zero, and the        overshoot phase detector outputs a logic one indicating the        delay of the insensitive delay line is longer. Both delay        elements in front of the phase detectors (CNTRL-3, CNTRL-4) are        set to a minimum value. Note the phase detectors are balanced        with the addition of mimic delay elements.    -   b. The delay of the sensitive delay chain (CNTRL-2) is increased        one delay step at a time until the phase detector indicates a        change in phase-output goes from a logic zero to a logic one or        vise versa. This is done with a quiet Vdd, as one example. At        this point, the two delay chain outputs should be within one        delay step of equal delay.

Operationally, if there is an overshoot in the power supply, thesensitive delay chain decreases in delay with a larger perturbation thanthe voltage insensitive delay line. This causes the signal output of thevoltage sensitive delay line to arrive at the phase detector inputsearlier in time relative to the other delay chain, causing a logic levelzero on the undershoot phase detector and a logic one of the overshootphase detector output. The opposite is true for an undershoot on thepower supply.

To program a threshold, CNTRL-3 and CNTRL-4 are preset to the desiredovershoot/undershoot detection value. For example, if a 50 pS phaseerror between the two delay chains is reached when there is a 10% changein supply, then CNTRL-3 and 4 are set to a value of 50 pS, i.e. 5 steps.The outputs of both phase detectors should now be a logic level zero. Ifthe power supply overshoots by 10% or more, the delay in the voltagesensitive delay line decreases causing the overshoot phase detectoroutput to change from a logic zero to a logic one. If the input pulsehas sufficient pulse width (at least 2× the phase error), the undershootphase detector remains at a logic level zero. If the power supply dippedby 10% or more, the delay in the voltage sensitive delay chain increasescausing the undershoot phase detector output to change from a logic zeroto a logic one. The output of the phase detector can also be attached toa counter to get a further understanding of how often the noise jumpsabove the threshold set by CNTRL-3 and CNTRL-4, or it may be connectedto a ‘sticky’ latch where one would only be interested, if the noiseever grew to that level.

Note the value of each step is assumed to be known using a delay chaincalibration circuit operating in parallel. This delay chain may includesensitive or insensitive delay elements or a combination thereof. Thecalibration circuit measures how many delay steps are in a clock period.Hence if the clock period is known, the magnitude of a delay step can becalculated.

To set the Vdd sensor noise frequency cut off, the length of the delaychain (CNTRL-1 & CNTRL-2) is programmable. As a general rule, if thenoise period is 2× larger than the length of the delay chain, the Vddsensor detects the noise. If the noise period is less than the length ofthe delay chain, it is averaged, and therefore, not detected. Hence, thefrequency characteristic of the noise can be characterized by presettingthe delay chain length. Note the input signal is to be proportional tothe amount of noise to be detected. The input rate should be as fast aspossible to maximize the sampling rate, but the pulse width is to be atleast 2× the maximum amount of phase error between the two delay chainsin a noisy environment. If the phase error between the two delay chainsexceeds the input pulse width, both the overshoot and undershoot signalschange to logic 1, causing the error signal to go high.

One example of the relationship between the delay of the delay chainswith variation in supply voltage is illustrated in FIG. 7. As depicted,as the supply voltage varies from −15% to 15% of its nominal value, thetwo delay chains show a steady variation in their delay from their delayat nominal voltage. The sensitive delay chain shows a change of about 1%for every percent change in supply voltage above or below a nominalvalue (e.g., 1.2V). The insensitive delay chain varies about 0.1% forevery 1% change in Vdd above or below the nominal value.

Described above is an on-chip sensor that is simple and flexible in thatit can be controlled. The sensor can be placed in many locations on achip to monitor various voltage supplies. Such chips can be used in manyelectronic devices, such as computers or other devices.

In one example, the on-chip sensor includes two delay chains: onereferred to as a sensitive delay chain and the other referred to as aninsensitive delay chain. The insensitive delay chain, as used herein, isa delay chain that is less sensitive than the sensitive delay chain.That is, the delay chains have different power supply sensitivities.Signals which have propagated down the two different paths havingdifferent power supply sensitivities are compared.

As one particular example, the insensitive delay chain is capable ofproviding delay that is insensitive to voltage fluctuation (i.e., noise,voltage sensitivity etc.). That is, typically, in a sensitive delaychain, the delay changes proportional to voltage fluctuation, e.g., a10% change in voltage yields a 10% change in delay. However, with theinsensitive delay chain, the delay is insensitive to voltage fluctuationin that a change in voltage fluctuation causes a less than proportionalchange in delay (e.g., a 10% change in voltage fluctuation yields lessthan a 10% change in delay). As one example, the delay is provided bydelay elements capable of producing constant delay regardless of powersupply variation. That is, there is little or no variation in the delay(e.g., approximately +/−1% of variation). In other embodiments, however,the change in delay is greater, but still less than proportional to thechange in voltage fluctuation. As examples, the change in delay may be+/−2%, 3% or other percents. These are all considered within the spiritof one or more aspects of the present invention.

Although examples are provided above, these are only examples. Manyvariations may be made without departing from the spirit of one or moreaspects of the present invention. For instance, different types oftransistors may be used in one or more of the structures or circuits,more or less transistors may be used in one or more of the structures orcircuits, etc. Further, structures or logic circuits other than inverterstructures may be used as or in the delay elements. Many othervariations are also possible.

Although various assumptions and design considerations are providedabove, these are only examples. Other or different assumptions and/ordesign considerations may be provided or included without departing fromthe spirit of one or more aspects of the present invention. Moreover,calibration may be performed in many ways.

The programmability of one or more of the delay chains is optional. Moreor less programmability may be provided.

The diagrams depicted herein are just examples. There may be manyvariations to these diagrams without departing from the spirit of theinvention. For instance, other types of transistors may be used.Additionally, more or less transistors may be used. All of thesevariations are considered a part of the claimed invention.

One or more aspects of the present invention may be performed insoftware, hardware or a combination thereof.

Although preferred embodiments have been depicted and described indetail herein, it will be apparent to those skilled in the relevant artthat various modifications, additions, substitutions and the like can bemade without departing from the spirit of the invention and these aretherefore considered to be within the scope of the invention as definedin the following claims.

1. A sensing circuit comprising: an on-chip sensor to detectvulnerability of a power supply of a chip comprising the on-chip sensor,said on-chip sensor detecting the vulnerability absent use of componentsexternal to the chip, wherein the on-chip sensor comprises a pluralityof delay chains to detect the vulnerability, the plurality of delaychains comprising a sensitive delay chain sensitive to variations involtage of the power supply and an insensitive delay chain insensitiveto variations in voltage of the power supply, and wherein thevulnerability to be detected is based on a user-defined thresholdprovided via one or more controls used to control one or more otherdelay chains coupled to at least one of the insensitive delay chain andthe sensitive delay chain.
 2. The sensing circuit of claim 1, whereinthe on-chip sensor further comprises one or more phase detectors coupledto the insensitive delay chain and the sensitive delay chain to comparea difference in phase between a propagation delay of the sensitive delaychain and a propagation delay of the insensitive delay chain.
 3. Thesensing circuit of claim 1, wherein at least one of the insensitivedelay chain and the sensitive delay chain is programmable to control anamount of delay through the delay chain.
 4. A chip comprising: a on-chipsensor to detect vulnerability of a power supply of the chip absent useof components external to the chip, the on-chip sensor comprising: asensitive delay chain sensitive to variations in voltage of the powersupply; and an insensitive delay chain insensitive to variations involtage of the power supply, the sensitive delay chain and theinsensitive delay chain used to detect the vulnerability, wherein thevulnerability to be detected is based on a user-defined thresholdprovided via one or more controls used to control one or more otherdelay chains coupled to at least one of the insensitive delay chain andthe sensitive delay chain.
 5. The chip of claim 4, wherein the on-chipsensor further comprises one or more phase detectors coupled to theinsensitive delay chain and the sensitive delay chain to compare adifference in phase between a propagation delay of the sensitive delaychain and a propagation delay of the insensitive delay chain.
 6. Thechip of claim 4, wherein at least one of the insensitive delay chain andthe sensitive delay chain is programmable to control an amount of delaythrough the delay chain.
 7. A method of detecting vulnerabilities ofpower supplies, said method comprising: detecting, using an on-chipsensor, vulnerability of a power supply of a chip comprising the on-chipsensor, wherein the on-chip sensor comprises a sensitive delay chainsensitive to variations in voltage of the power supply and aninsensitive delay chain insensitive to variations in voltage of thepower supply, the sensitive delay chain and the insensitive delay chainemployed to detect the vulnerability, and wherein an output of theinsensitive delay chain is a delayed signal that is coupled to an inputof a first phase detector and an input of a second phase detector, andan output of the sensitive delay chain is a delayed signal that iscoupled to an input of the first phase detector and an input of thesecond phase detector, and wherein the first phase detector and thesecond phase detector are used to compare the difference in phasebetween the delayed signals from the sensitive delay chain and theinsensitive delay chain to detect vulnerability; and wherein the delayedsignals from the insensitive delay chain and the sensitive delay chainare further delayed using a plurality of delay chains, said plurality ofdelay chains coupled to the output of insensitive delay chain and theoutput of sensitive delay chain and coupled to one or more inputs of thefirst phase detector and one or more inputs of the second phasedetector.
 8. The method of claim 7, wherein the vulnerability isdetected by comparing a difference in phase between a propagation delayof the insensitive delay chain and a propagation delay of the sensitivedelay chain.
 9. The method of claim 7, wherein at least one delay chainof the plurality of delay chains is programmable to enable avulnerability to be detected that is based on a user-defined threshold.10. The method of claim 7, wherein at least one of the insensitive delaychain and the sensitive delay chain is programmable to control an amountof delay through the delay chain.
 11. The method of claim 7, wherein theinsensitive delay chain comprises a plurality of insensitive delayelements.
 12. The method of claim 7, wherein the sensitive delay elementcomprises a plurality of sensitive delay elements.
 13. The method ofclaim 7, wherein the vulnerability comprises one of an overshoot or anundershoot of the voltage of the power supply.
 14. The method of claim7, wherein the detecting comprises using one delay chain and anotherdelay chain, the one delay chain and the another delay chain havingdifferent power supply sensitivities.